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  • Dependent binary relevance models for multi-label classification [2013]

    Category:
    Artículos
    Authors:
    Eyke Hüllermeier , Juan José del Coz Díaz , José Ramón Quevedo Pérez , José Barranquero Tolosa , Robin Senge , Elena Montañés Roces
    Date:
    01 of January of 2013
    It Is a Part of:
    Pattern Recognition